Daily Program

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Mon 19 Apr Tue 20 Apr Wed 21 Apr Thu 22 Apr Fri 23 Apr

09:30 SiliconPV Opening Session
Welcome to SiliconPV 2021
Rolf Brendel, Institute for Solar Energy Research Hamelin (ISFH)
Welcome from the Organizers
Beatrix Feuerbach, PSE Conferences and Consulting
09:50 High Efficiency Solar Cells from Lab to Fab
Chair: Anamaria Moldovan (Fraunhofer ISE) & Pierre Verlinden (Amrock)
KEYNOTE: Transparent Passivating Contact for Crystalline Silicon Solar Cells Approaching Efficiencies of 24%
Kaining Ding, Research Center Jülich
LeTID Sensitivity of Gallium and Boron-Doped Cz-Si PERC Solar Cells with an Average Conversion Efficiency of 23.6 %
Friederike Kersten, Hanwha Q CELLS GmbH
23%-Efficient Screen-Printed IBC Cells on Cz-Grown Silicon with n-Type Poly-Si Passivating Contact and Al-alloyed p-Type Contact
Felix Haase, Institute for Solar Energy Research Hamelin (ISFH)
Q&A Session
11:00 Break
11:30 Poster Session MON 1
Chair: Christian Hagendorf (Fraunhofer CSP) & Rune Søndenå (IFE)
A - Reliability and Yield | B - Characterization of Defects in Monocrystalline Silicon | C - Cell Characterization
Application of Transparent Grid Backsheet and Grid Glass to the Power Generation of Bifacial Photovoltaic Module
Jianhui Jiang, Suzhou Talesun Solar Technologies Co., Ltd
Analysis of Partial Shading Effect on the Crystalline Silicon Photovoltaic Module Temperature Distribution
Humaid Mohammed Niyaz, Indian Institute of Technology Bombay
Comparative Performance Evaluation of Multi-crystalline and Thin-film PV Technologies on the Water Surface
Humaid Mohammed Niyaz, Indian Institute of Technology Bombay
Investigation of Front-Side Grey Delamination in Crystalline Silicon Photovoltaic Modules
Roopmati Meena, Indian Institute of Technology Bombay
Improvement of the PID Problem of Bifacial PERC Solar Modules Based on Rear Passivation Coating Optimization
Shude Zhang, Suzhou Talesun Solar Technologies Co., Ltd.
Extended Modelling of Surface Related Degradation
Ruy Sebastian Bonilla, University of Oxford
The Micro Characteristics of the Defect Layers Induced by Slurry-Wire and Diamond-Wire Sawing Methods
Hangfei Li, State Key Laboratory of Silicon Materials and School of Materials Science and Engineering
Modelling Fe Distribution in the Crucible-Coating-Silicon Ingot System
Mohammed M’Hamdi, SINTEF Industry, Norwegian University of Science and Technology
Temperature-Dependent Performance of Silicon Wafers: the Impact of Gettering and Hydrogen Passivation
Shuai Nie, University of New South Wales
Modelling Seed Joint Grain Boundaries in Cast Monocrystalline Silicon
Shuai Yuan, Zhejiang University
Simultaneous Determination of Free-Carrier Absorption and Rear-Side Reflectance in Textured Silicon Solar Cells
Luigi Abenante, ENEA, Italian National Agency for New Technologies, Energy and Sustainable Economic Development
Low-Budget Photoluminescence Imaging
Johannes Greulich, Fraunhofer ISE
Contactless Sheet Resistance Characterization of Amorphous Silicon/Crystalline Silicon Heterojunction Solar Cell Structures Using Differential Junction Photovoltage Technique
Ferenc Korsós, Semilab Co. Ltd.
Measuring the Spectral Irradiance of Solar Simulators
Carsten Schinke, Institute for Solar Energy Research Hamelin (ISFH)
0.3% Efficiency Improvement for n-PERT Solar Cells with Illuminated Hydrogenation Process
Matthew Wright, University of New South Wales
12:00 Long Break
13:00 Poster Session MON 2
Chair: Daming Chen (Trina Solar) & Dennis Bredemeier (ISFH)
A - Reliability and Yield | B - Characterization of Defects in Monocrystalline Silicon | C - Cell Characterization
Reversible Junction-Box Degradation in Actual PV-Module Arrays
Luigi Abenante, ENEA, Italian National Agency for New Technologies, Energy and Sustainable Economic Development
Case Study on the Dependency of the Degradation Rate on Degradation Modes and Methodology using Monitoring Data
Janine Denz, Research Center Jülich GmbH
Damp Heat Degradation of Polycrystalline Silicon Passivated Contacts
San Theingi, National Renewable Energy Laboratory
Full Analysis of Series Resistance Components and Their Degradation in Temperature Cycling of PERC Solar Cells
Tobias Urban, Institute of Applied Physics / Technische Universität Bergakademie Freiberg
Inline and Offline Characterization of Stacking Faults in Epitaxial Wafers
Saed Al-Hajjawi, Fraunhofer ISE
Formation and Elimination of Electrically Active Thermally-Induced Defects in Float-Zone-Grown Silicon Crystals
Joyce Ann T. De Guzman, University of Manchester
Identification of the LeTID Defect Formation as a Hydrogen-Related Dissociation Process
Benjamin Hammann, Fraunhofer ISE
Contacted Resistance Measurements for the Quantification of Boron-Hydrogen Pairs in Crystalline Silicon
Axel Herguth, University of Konstanz
Understanding the Origin ff Tabula Rasa Process-Induced Defects in CZ n-type c-Si
Jorge Ochoa, Arizona State University
Using Doping Variation to Determine Surface Recombination Current at I-V Test
Karoline Dapprich, Sinton Instruments
Injection Dependence of the Local Series Resistance: Extending the Illumination Intensity Variation Method
Jan-Martin Wagner, University of Kiel
Transient Electrical Characteristics of Silicon Hetero Junction Solar Cells Under Fast Transient Illumination
Gustav Wetzel, Institute of Electronic Materials and Devices / Leibniz University Hannover
13:30 Short Break
13:45 Cell Characterization
Chair: Stefan Glunz (Fraunhofer ISE) & Marko Topič (University of Ljubljana)
Modelling Free-Carrier Absorption Losses in Silicon Solar Cells Using a Lumped Parasitic Absorption Parameter
Andreas Fell, Fraunhofer ISE
I-V-Curve Analysis Using Evolutionary Algorithms: Hysteresis Compensation in Fast Sun Simulator Measurements of HJT Solar Cells
David Hevisov, Fraunhofer CSP
Characterization of a Cell Process from IV Cell-Test Data
Ronald Sinton, Sinton Instruments
Determination of Base Doping Concentration of Silicon Solar Cells from Light IV-curves
Klaus Ramspeck, h.a.l.m. elektronik GmbH
Fast Changing Field Effect Passivation States due to Potential Induced Degradation at the Rear Side of Bifacial Silicon Solar Cells
Kai Sporleder, Fraunhofer CSP
Q&A Session
15:00 Break
15:30 Module Yield & Reliability
Chair: Jef Poortmans (imec) & Rainer Grischke (Meyer Burger)
Spectral Classification and Lab Based Energy-Yield Measurements
Ian Marius Peters, Research Center Jülich
Root Cause Analysis of Solar Cell Cracks at Shingle Joints
Nils Klasen, Fraunhofer ISE
PV-Modules and Their Backsheets – Findings in Solarparks –
Claudia Buerhop-Lutz, HI ERN
Potential Induced Degradation of Bifacial TOPCon Modules with Variations of Emitter and Passivating Dielectric Stack
Bart Geerligs, TNO Energy Transition
Desert Label Development for Improved Reliability and Durability of Photovoltaic Modules in Harsh Desert Conditions
Romain Couderc, CEA-INES
Q&A Session
16:45 Break
17:15 Social Event: Speed Dating
Get in touch with other participants in small randomly assembled groups.